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time-voltage test

См. также в других словарях:

  • Voltage doubler — A voltage doubler is an electronic circuit which charges capacitors from the input voltage and switches these charges in such a way that, in the ideal case, exactly twice the voltage is produced at the output as at its input. The simplest of… …   Wikipedia

  • Test and tagging — is a generic name given to the process of visually inspecting and electrically testing in service electrical equipment for personal use and/or safety. Colloquially, it is also referred to as; tagging, test tag, test and tag, electrical tagging,… …   Wikipedia

  • Time-Domain Thermoreflectance — is a method by which the thermal properties of a material can be measured, most importantly thermal conductivity. This method can be applied most notably to thin film materials (up to hundreds of nanometers thick), which have properties that vary …   Wikipedia

  • Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

  • Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… …   Wikipedia

  • Test card — A test card, also known as a test pattern in the UK, North America and Australia, is a television test signal, typically broadcast at times when the transmitter is active but no program is being broadcast (often at startup and closedown). Used… …   Wikipedia

  • Time-domain reflectometer — A time domain reflectometer (TDR) is an electronic instrument used to characterize and locate faults in metallic cables (for example, twisted wire pairs, coaxial cables). The equivalent device for optical fiber is an optical time domain… …   Wikipedia

  • Time resolved photon emission prober — The Time Resolved Photon Emission Prober (TRPE) is an instrument which is used to measure timing waveforms on semiconductor devices. TRPE measurements are performed on the back side of the semiconductor device. The substrate of the device under… …   Wikipedia

  • Open-circuit time constant method — The open circuit time constant method is an approximate analysis technique used in electronic circuit design to determine the corner frequency of complex circuits. It also is known as the zero value time constant technique. The method provides a… …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • Dual-Axis Radiographic Hydrodynamic Test Facility — An explosion being studied at DARHT The Dual Axis Radiographic Hydrodynamic Test Facility (DARHT) is a facility at Los Alamos National Laboratory which is part of the Department of Energy s stockpile stewardship program. It uses two large x ray… …   Wikipedia

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